Femtosecond Measurements Combined with Near- Field Optical Microscopy
نویسنده
چکیده
منابع مشابه
An overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملNear-field optical photomask repair with a femtosecond laser.
We present a high-resolution near-field optical tool designed for repair of opaque defects in binary photomasks. Both instrument design and near-field imaging and patterning results will be presented. Designed for ablative processing of thin metal films, the MR-100 incorporates an industrial amplified femtosecond laser, third harmonic generator and built-in autocorrelator. The ultrashort durati...
متن کاملNear-field optical microscopy of femtosecond-laser-reshaped silver nanoparticles in dielectric matrix
: Samples containing single silver nanoparticles have been irradiated by intense femtosecond laser pulses to gain a persistent transformation of their shape to ellipsoidal forms. Irradiated and non-irradiated regions of these samples have been analyzed by microscope spectrometry as well as near-field scanning optical microscopy (NSOM) with several wavelengths and different linear polarizations....
متن کاملImaging optical near-fields of nanostructures
We present a method for imaging the optical near-fields of nanostructures, which is based on the local ablation of a smooth silicon substrate by means of a single, femtosecond laser pulse. At those locations, where the field enhancement due to a nanostructure is large, substrate material is removed. The resulting topography, imaged by scanning electron or atomic force microscopy, thus reflects ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 2011